Certificate of Conformance - BPM Micro



Bad-Block Management Scheme and ECC Questionnaire

Purpose: To provide customers with a consistent process by which they can define their Bad-Block Management (BBM) requirements for implementation in BPWin software.

1. Provide the Bad-Block Scheme type or name. If this is a “custom” bad block scheme, and we do support your project we will incorporate the name you provide for the Bad Block Scheme into our software. If you have concerns over the naming of the scheme in our software, please be sure to provide a name that will be appropriate for release.

2. Provide a graphical representation of how your bad-block scheme would handle a device that had a bad block at block 3, 7, and 10 (if not simple bad block skip). Refer to the BPM Microsystems’ White Paper “Understand NAND Flash Factory Programming” for a graphical example. A link to the white paper is at the end of this document.

3. Does your BBM scheme use the spare area? If yes, what sort of data will be programmed into the spare area (normal data, ECCs, or other dynamic data)?

4. If spare area is used for ECC or dynamic data, will the data be contained in your programming data file, or does BPM need to calculate the values?

5. If the spare area information is to be calculated by BPM, please provide the structure of the spare area. The structure is the content layout. Define where the items are located within the spare area, byte by byte.

6. If you require that BPWin compute the ECC, you must provide the ECC algorithm source code in an electronic readable format (text file).

7. Is the first block of each partition required to be good?

8. Are there any partitions in your image file that must go at fixed location(s) in the device; regardless of whether any bad blocks are encountered prior to that location? If yes, please indicate which partition(s) must start at the fixed location.

9. What is the number of good blocks required for each partition?

10. Will your data file be constructed with Free Good Block formatting? Normally free good blocks are at a virgin state of FFh.

11. Is there any meta-data that needs to be programmed in the device that must be calculated by BPM? Examples would be bad block tables, partition information, etc. If so, please provide the structure in detail and be sure to specify “Endianess.”

12. Is there anything else that needs to be programmed into your device that will need to be computed or handled in a special way by BPM? If so, please provide a complete description and any applicable code to assist us so that we support the requirement.

13. What’s the maximum data file size for your application? State the file size including the unit of measure as either Bytes, MBytes, or GBytes.

14. Would you be able to provide 2 pre-programmed samples to us to use for validation? Please make sure that each sample being provided has at least one bad block. Physically mark the devices to indicate they are programmed. Also, include 5 blank devices.

15. Provide a technical contact, including email and phone number, with whom we can discuss technical requirements or clarifications.

More information about NAND Flash Factory Programming is described in our white paper available at:



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