Microsoft Word
Tutorial Session T1 & T2. 14:00-17:15. Tutorial Session T3 & T4 ... A Wafer Map Defect Pattern Classification Model Based on Deep Convolutional Neural Network. Nov.4. Dong-yang Du*, Zheng Shi. Institute of VLSI Design, Zhejiang University, Hangzhou, China ... Hardware Trojan Attacks on the Reconfigurable Interconnections of Convolutional Neural ... ................
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