Final Examination Study Guide Template
In [3], Van de Goor describes a method for efficiently converting a bit-oriented memory march test such as March LR and March C- to word-oriented memory (WOM) tests. WOM march tests can detect inter-word faults (faults among words) and intra-word faults (faults within words). V4 block RAMs have the ability to address words within a line of memory. ................
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