UG116 (v10.14) April 23, 2021 Device Reliability Report
Chapter 1: The Reliability Program Updated ESD and LU test data. Added a definition of obsolete. Chapter 2: Results by Product Family Updated many tables and deleted tables for obsolete products. Added new tables for CMOS device types XC4Vxxx, XC5Vxxx, and XC6Vxxx (Table 2-48 through Table 2-50). Added a note to Table 2-21. Revision History ................
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