Microsoft Word - ICSICT
A Wafer Map Defect Pattern Classification Model Based on Deep Convolutional Neural Network. Nov.4. Dong-yang Du*, Zheng Shi ... Small-world-based Structural Pruning for Efficient FPGA Inference of Deep Neural Networks. Nov.5 (Invited) Gokul Krishnan1, Yufei Ma2, Yu Cao1 ... Detailed Routing Short Violations Prediction Method Using Graph ... ................
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