Microsoft Word - ICSICT

A Wafer Map Defect Pattern Classification Model Based on Deep Convolutional Neural Network. Nov.4. Dong-yang Du*, Zheng Shi ... Small-world-based Structural Pruning for Efficient FPGA Inference of Deep Neural Networks. Nov.5 (Invited) Gokul Krishnan1, Yufei Ma2, Yu Cao1 ... Detailed Routing Short Violations Prediction Method Using Graph ... ................
................