Yield Modeling and Analysis Prof. Robert C. Leachman IEOR ...

then the yield loss contribution of each step or layer is easily identified, as the overall die yield has a product form: . 1 0 1 ∏ = − − = ∑ = = = n i AD A D i n i i DY e e e. Using this product form, one can calculate the yield improvement to be gained from reductions in defect density achieved at various steps or layers. For example ... ................
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