University of California at Berkeley
NAME: _____________________________________________________ SID: ______________
University of California at Berkeley
College of Engineering
Department of Electrical Engineering and Computer Science
EECS 150 R. H. Katz
Spring 2007 10 April 2007
Quiz #6: Test Generation
Closed Book! Open Neighbor!
Given the following simple circuit:
A graduate of the Stanford EE program claims that the test vectors abc = 010, 011, and 110 would cover all of the possible stuck-at-1 and stuck-at-0 faults in this circuit.
The following chart proves that the Stanford grad made a mistake:
Test |a/0 |a/1 |b/0 |b/1 |c/0 |c/1 |d/0 |d/1 |f/0 |f/1 | |010 | |√ | | | |√ | |√ | |√ | |011 | | |√ | |√ | |√ | |√ | | |110 |√ | | | | | | | |√ | | |001 | |√ | |√ | | | |√ | |√ | |
a) Which fault is not covered? b/1
b) Add one additional test vector – the last row in the table above –to augment the test set to now cover the missing fault. Indicate in the table all faults covered by the test vector that you added, by marking the appropriate column with an √.
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